NSS-01-069 – High-voltage stress test and thermal recovery of an amorphous-silicon-passivated planar HPGe detector (#2646)
L. Han, Y. Li, L. He, S. Yu, X. Li, M. Yang, Y. Li, Y. Tian
Session: NSS-01 - NSS Poster Session
Date: Monday, 9 November, 2026, 15:00
Location: Poster Area (PA)