MIC-10-287 – Residual Scatter Correction Using Grid-Wall Shadow Sampling in Cone-Beam CT with a Two-Dimensional Anti-Scatter Grid (#2293)
J. Park, S. Cho, H. Yang, D. Jeon, D.Y. Han, H. Cho
Session: MIC-10 - MIC Poster Session 2
Date: Thursday, 12 November, 2026, 17:30
Location: Poster Area (PA)