MIC-15-165 – Effects of Deep Learning Model Optimization for Metal Artefact Reduction in Spectral Photon-Counting Computed Tomography (#2581)
O. S. Khan, B. Tariq, A. Behouch, N. Maalej, M.S. Jouini, A. Y. Raja
Session: MIC-15 - MIC Poster Session 3
Date: Friday, 13 November, 2026, 15:00
Location: Poster Area (PA)