NSS-28-03 – Geometry-Defined Impact Ionization in Two-Stage Mesa-Type Silicon Electron Multipliers (#1064)
H. Sonobe, N. Kamiya, T. Kobayashi, R. Shiozaki, Y. Matsunaga
Session: NSS-28 - Semiconductor detectors
Date: Thursday, 12 November, 2026, 15:30
Location: PICASSO ()