NSS-13-090 – Characterization of Single-Event Upsets in a 90 nm Commercial Off-the-shelf SRAM caused by Low-Energy Protons (#1482)
S. Ishihara, Y. Uchida, S. Toyama, W. Kada, S. Matsuyama
Session: NSS-13 - NSS Poster Session
Date: Wednesday, 11 November, 2026, 11:30
Location: Poster Area (PA)