NSS-21-07 – Comparative Study of NIEL Effects on Dark Count Rate in 110 nm CMOS SPADs Under Neutron, Proton and Electron Irradiation (#1251)
M. Campajola, A. Burdyko, G. Collazuol, M. Da Rocha Rolo, G. De Nardo, F. Di Capua, D. Falchieri, F. Fienga, G. Fiorillo, T. Floris, F. Licciulli, L. Maresca, M.N. Mazziotta, L. Pancheri, R. Preghenella, L. Ratti, L. Rignanese, R. Santoro, F. Shojaei, C. Vacchi
Session: NSS-21 - Photodetectors
Date: Thursday, 12 November, 2026, 10:30
Location: MACHADO ()