NSS-13-066 – Neutron Measurements of 252Cf in High-Gamma-Ray Environments Using Silicon Carbide (SiC) Semiconductor Detector (#2326)
K. Nagai, K. Aoyama, T. Suzuki, T. Nakamura, T. Matsumoto, A. Masuda, S. Manabe, J. Ishii, K. Shimazoe
Session: NSS-13 - NSS Poster Session
Date: Wednesday, 11 November, 2026, 11:30
Location: Poster Area (PA)