RTSD-04-399 – Characterization and Compensation of Radiation-Induced Leakage Current in CdTe/CZT Detectors Under High-flux X-ray Irradiation (#2377)
X. Ran, Z. Deng, H. Luo, H. Dong
Session: RTSD-04 - RTSD Poster Session
Date: Tuesday, 10 November, 2026, 15:00
Location: Poster Area (PA)